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- W2306957349 abstract "Electrostatic force microscopy (EFM) is often used for nanoscale dielectric spectroscopy, the measurement of local dielectric properties of materials as a function of frequency. However, the frequency range of atomic force microscopy (AFM)-based dielectric spectroscopy has been limited to a few kilohertz by the resonance frequency and noise of soft microcantilevers used for this purpose. Here, we boost the frequency range of local dielectric spectroscopy by 3 orders of magnitude from a few kilohertz to a few megahertz by developing a technique that exploits the high resonance frequency and low thermal noise of ultrasmall cantilevers (USCs). We map the frequency response of the real and imaginary components of the capacitance gradient (∂C(ω)/∂z) by using second-harmonic EFM and a theoretical model, which relates cantilever dynamics to the complex dielectric constant. We demonstrate the method by mapping the nanoscale dielectric spectrum of polymer-based materials for organic electronic devices. Beyond offering a powerful extension to AFM-based dielectric spectroscopy, the approach also allows the identification of electrostatic excitation frequencies which affords high dielectric contrast on nanomaterials." @default.
- W2306957349 created "2016-06-24" @default.
- W2306957349 creator A5010598326 @default.
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- W2306957349 date "2016-03-21" @default.
- W2306957349 modified "2023-10-14" @default.
- W2306957349 title "Nanoscale Mapping of Dielectric Properties of Nanomaterials from Kilohertz to Megahertz Using Ultrasmall Cantilevers" @default.
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- W2306957349 doi "https://doi.org/10.1021/acsnano.5b06893" @default.
- W2306957349 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/26972782" @default.
- W2306957349 hasPublicationYear "2016" @default.
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