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- W2314336246 abstract "In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic is required and allows microcontrollers at-speed testing. Moreover, posteriori values are given for some types of memories faults coverage when pseudo-ring testing schemes are applied." @default.
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- W2314336246 date "2012-07-31" @default.
- W2314336246 modified "2023-09-26" @default.
- W2314336246 title "Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms" @default.
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- W2314336246 doi "https://doi.org/10.5121/ijdps.2012.3403" @default.
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