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• W2314373314 abstract "Single Event Upsets (SEUs) pose a serious threat to computer reliability and longevity. SEU effects are found at sea level, in airborne avionics, and in space. At the system level, SEUs in processors are controlled by replication and voting, watchdog processors, and tagged data schemes. SEUs in memory subsysterns are controlled by periodically scrubbing words protected by an Error Control C'ode (ECC). The rate of menlory scrubbing affects the performance and reliability of the entire computer system. There are tradeoffs between using radiationhardened senliconductors, scrubbing rates, and ECC capabilities. Previous tradeoff analyses have used sirnplified analytic models. The system effects of SEUs may be evaluated by Markov modeling. Markov modeling has been extensively used for modeling processor redundancy; here it is also used for memory subsystems. A nodel ling methodology is presented which extrapolates chip transient and permanent failure rates to the system level, allows evaluation of alternative ECCs, and permits sensitivity analyses. The results for an exarnple memory subsystelli show that scrubbing effectiveness may be relatively insensitive to scrubh~ng rate." @default.
• W2314373314 created "2016-06-24" @default.
• W2314373314 creator A5062298011 @default.
• W2314373314 date "1989-08-17" @default.
• W2314373314 modified "2023-09-25" @default.
• W2314373314 title "System effects of single event upsets" @default.
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• W2314373314 doi "https://doi.org/10.2514/6.1989-3126" @default.
• W2314373314 hasPublicationYear "1989" @default.
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