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- W2320005004 abstract "Current AVO analysis is generally based on the model of single interface separating two half spaces. This assumption ignores the presence of widespread thin-layer formations in the subsurface whose AVO response is very different from the case of a single interface. In this paper, we exploit the spectrum characteristics of the AVO response of a fractured thin-layer reservoir. The peak frequencies of both P-P and P-S waves reflected from the thin reservoir deviate from each other and vary with offset, which are not observed for the reflection from a single interface. And the offset-dependent peak frequency of P-P wave is also a good indicator of the variation of crack density for thin reservoirs. Also, azimuthally offsetdependent peak frequencies of P-P and P-S waves can be used to analyze the crack azimuth for both single interface and thin bed reflection." @default.
- W2320005004 created "2016-06-24" @default.
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- W2320005004 date "2010-01-01" @default.
- W2320005004 modified "2023-09-26" @default.
- W2320005004 title "Cracked thin layered reservoir analysis using offset‐dependent spectrum characteristics" @default.
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- W2320005004 doi "https://doi.org/10.1190/1.3513822" @default.
- W2320005004 hasPublicationYear "2010" @default.
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