FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2320062858> ?p ?o ?g. }

• W2320062858 abstract "What the experts have to say about Model-Based Testing for Embedded Systems: This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems. is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students. Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA This handbook is the best resource I am aware of on the automated testing of embedded It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems. Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today. Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comt, Besanon, France, and co-author of Practical Model-Based Testing" @default.
• W2320062858 created "2016-06-24" @default.
• W2320062858 creator A5008794412 @default.
• W2320062858 creator A5023756735 @default.
• W2320062858 creator A5084815619 @default.
• W2320062858 date "2017-12-19" @default.
• W2320062858 modified "2023-10-14" @default.
• W2320062858 title "Model-Based Testing for Embedded Systems" @default.
• W2320062858 cites W1498542756 @default.
• W2320062858 cites W1522465028 @default.
• W2320062858 cites W1544621933 @default.
• W2320062858 cites W1591022969 @default.
• W2320062858 cites W1596127723 @default.
• W2320062858 cites W1622563620 @default.
• W2320062858 cites W1787500456 @default.
• W2320062858 cites W1983843822 @default.
• W2320062858 cites W1992029730 @default.
• W2320062858 cites W2001985931 @default.
• W2320062858 cites W2007628259 @default.
• W2320062858 cites W2076253536 @default.
• W2320062858 cites W2133900335 @default.
• W2320062858 cites W2143236904 @default.
• W2320062858 cites W2149041900 @default.
• W2320062858 cites W2151297712 @default.
• W2320062858 cites W2151926351 @default.
• W2320062858 cites W2161836710 @default.
• W2320062858 cites W2164209468 @default.
• W2320062858 cites W2166461985 @default.
• W2320062858 cites W2544293008 @default.
• W2320062858 cites W68130004 @default.
• W2320062858 cites W3185910042 @default.
• W2320062858 doi "https://doi.org/10.1201/b11321" @default.
• W2320062858 hasPublicationYear "2017" @default.
• W2320062858 type Work @default.
• W2320062858 sameAs 2320062858 @default.
• W2320062858 citedByCount "40" @default.
• W2320062858 countsByYear W23200628582012 @default.
• W2320062858 countsByYear W23200628582013 @default.
• W2320062858 countsByYear W23200628582014 @default.
• W2320062858 countsByYear W23200628582015 @default.
• W2320062858 countsByYear W23200628582016 @default.
• W2320062858 countsByYear W23200628582017 @default.
• W2320062858 countsByYear W23200628582018 @default.
• W2320062858 countsByYear W23200628582019 @default.
• W2320062858 countsByYear W23200628582020 @default.
• W2320062858 countsByYear W23200628582021 @default.
• W2320062858 countsByYear W23200628582023 @default.
• W2320062858 crossrefType "reference-book" @default.
• W2320062858 hasAuthorship W2320062858A5008794412 @default.
• W2320062858 hasAuthorship W2320062858A5023756735 @default.
• W2320062858 hasAuthorship W2320062858A5084815619 @default.
• W2320062858 hasConcept C41008148 @default.
• W2320062858 hasConceptScore W2320062858C41008148 @default.
• W2320062858 hasLocation W23200628581 @default.
• W2320062858 hasOpenAccess W2320062858 @default.
• W2320062858 hasPrimaryLocation W23200628581 @default.
• W2320062858 hasRelatedWork W1596801655 @default.
• W2320062858 hasRelatedWork W2130043461 @default.
• W2320062858 hasRelatedWork W2350741829 @default.
• W2320062858 hasRelatedWork W2358668433 @default.
• W2320062858 hasRelatedWork W2376932109 @default.
• W2320062858 hasRelatedWork W2382290278 @default.
• W2320062858 hasRelatedWork W2390279801 @default.
• W2320062858 hasRelatedWork W2748952813 @default.
• W2320062858 hasRelatedWork W2899084033 @default.
• W2320062858 hasRelatedWork W2530322880 @default.
• W2320062858 isParatext "false" @default.
• W2320062858 isRetracted "false" @default.
• W2320062858 magId "2320062858" @default.
• W2320062858 workType "book" @default.