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• W2328512096 abstract "Technology based on electric-field-induced instabilities on thin polymer film surfaces has emerged as a promising candidate for soft lithography. Typically, the instability is modeled using the perfect dielectric (PD) or the leaky dielectric (LD) model. These assume the electric diffuse layer to be infinitesimally large or small, respectively. In the present work we conduct stability analysis assuming a PD-electrolyte solution interface. The concentration of ions and, hence, the diffuse layer thickness is in general assumed to be of the same order as the electrolyte film thickness. The PD-LD models are then realized as limiting cases of the ratio of the double layer thickness to the film thickness." @default.
• W2328512096 created "2016-06-24" @default.
• W2328512096 creator A5006694294 @default.
• W2328512096 creator A5022401502 @default.
• W2328512096 date "2014-03-26" @default.
• W2328512096 modified "2023-10-16" @default.
• W2328512096 title "Electrokinetic model for electric-field-induced interfacial instabilities" @default.
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• W2328512096 doi "https://doi.org/10.1103/physreve.89.032409" @default.
• W2328512096 hasPubMedId "https://pubmed.ncbi.nlm.nih.gov/24730854" @default.
• W2328512096 hasPublicationYear "2014" @default.
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