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• W2331717731 endingPage "2914" @default.
• W2331717731 startingPage "2904" @default.
• W2331717731 abstract "The low-energy proton energy spectra of all shielded space environments have the same shape. This shape is easily reproduced in the laboratory by degrading a high-energy proton beam, producing a high-fidelity test environment. We use this test environment to dramatically simplify rate prediction for proton direct ionization effects, allowing the work to be done at high-energy proton facilities, on encapsulated parts, without knowledge of the IC design, and with little or no computer simulations required. Proton direct ionization (PDI) is predicted to significantly contribute to the total error rate under the conditions investigated. Scaling effects are discussed using data from 65-nm, 45-nm, and 32-nm SOI SRAMs. These data also show that grazing-angle protons will dominate the PDI-induced error rate due to their higher effective LET, so PDI hardness assurance methods must account for angular effects to be conservative. We show that this angular dependence can be exploited to quickly assess whether an IC is susceptible to PDI." @default.
• W2331717731 created "2016-06-24" @default.
• W2331717731 creator A5010472455 @default.
• W2331717731 creator A5011631892 @default.
• W2331717731 creator A5012748950 @default.
• W2331717731 creator A5012951397 @default.
• W2331717731 creator A5024798593 @default.
• W2331717731 creator A5027850721 @default.
• W2331717731 creator A5036215209 @default.
• W2331717731 creator A5042209105 @default.
• W2331717731 creator A5056531847 @default.
• W2331717731 creator A5056997589 @default.
• W2331717731 creator A5058212142 @default.
• W2331717731 creator A5072882800 @default.
• W2331717731 creator A5073466921 @default.
• W2331717731 creator A5079858243 @default.
• W2331717731 creator A5081369057 @default.
• W2331717731 creator A5083591096 @default.
• W2331717731 creator A5085206225 @default.
• W2331717731 creator A5087354887 @default.
• W2331717731 date "2014-12-01" @default.
• W2331717731 modified "2023-10-01" @default.
• W2331717731 title "Hardness Assurance for Proton Direct Ionization-Induced SEEs Using<newline/> a High-Energy Proton Beam" @default.
• W2331717731 cites W1981414041 @default.
• W2331717731 cites W1987540041 @default.
• W2331717731 cites W1996427318 @default.
• W2331717731 cites W2001440578 @default.
• W2331717731 cites W2067354838 @default.
• W2331717731 cites W2093314854 @default.
• W2331717731 cites W2106460042 @default.
• W2331717731 cites W2118016331 @default.
• W2331717731 cites W2122954231 @default.
• W2331717731 cites W2124869915 @default.
• W2331717731 cites W2141585946 @default.
• W2331717731 cites W2151172808 @default.
• W2331717731 cites W2152763335 @default.
• W2331717731 cites W2153749460 @default.
• W2331717731 cites W2163180702 @default.
• W2331717731 cites W2169258471 @default.
• W2331717731 cites W2176022708 @default.
• W2331717731 cites W4253056353 @default.
• W2331717731 doi "https://doi.org/10.1109/tns.2014.2364953" @default.
• W2331717731 hasPublicationYear "2014" @default.
• W2331717731 type Work @default.
• W2331717731 sameAs 2331717731 @default.
• W2331717731 citedByCount "39" @default.
• W2331717731 countsByYear W23317177312013 @default.
• W2331717731 countsByYear W23317177312014 @default.
• W2331717731 countsByYear W23317177312015 @default.
• W2331717731 countsByYear W23317177312016 @default.
• W2331717731 countsByYear W23317177312017 @default.
• W2331717731 countsByYear W23317177312018 @default.
• W2331717731 countsByYear W23317177312019 @default.
• W2331717731 countsByYear W23317177312020 @default.
• W2331717731 countsByYear W23317177312021 @default.
• W2331717731 countsByYear W23317177312022 @default.
• W2331717731 countsByYear W23317177312023 @default.
• W2331717731 crossrefType "journal-article" @default.
• W2331717731 hasAuthorship W2331717731A5010472455 @default.
• W2331717731 hasAuthorship W2331717731A5011631892 @default.
• W2331717731 hasAuthorship W2331717731A5012748950 @default.
• W2331717731 hasAuthorship W2331717731A5012951397 @default.
• W2331717731 hasAuthorship W2331717731A5024798593 @default.
• W2331717731 hasAuthorship W2331717731A5027850721 @default.
• W2331717731 hasAuthorship W2331717731A5036215209 @default.
• W2331717731 hasAuthorship W2331717731A5042209105 @default.
• W2331717731 hasAuthorship W2331717731A5056531847 @default.
• W2331717731 hasAuthorship W2331717731A5056997589 @default.
• W2331717731 hasAuthorship W2331717731A5058212142 @default.
• W2331717731 hasAuthorship W2331717731A5072882800 @default.
• W2331717731 hasAuthorship W2331717731A5073466921 @default.
• W2331717731 hasAuthorship W2331717731A5079858243 @default.
• W2331717731 hasAuthorship W2331717731A5081369057 @default.
• W2331717731 hasAuthorship W2331717731A5083591096 @default.
• W2331717731 hasAuthorship W2331717731A5085206225 @default.
• W2331717731 hasAuthorship W2331717731A5087354887 @default.
• W2331717731 hasBestOaLocation W23317177312 @default.
• W2331717731 hasConcept C120665830 @default.
• W2331717731 hasConcept C121332964 @default.
• W2331717731 hasConcept C1276947 @default.
• W2331717731 hasConcept C145148216 @default.
• W2331717731 hasConcept C168834538 @default.
• W2331717731 hasConcept C184779094 @default.
• W2331717731 hasConcept C185544564 @default.
• W2331717731 hasConcept C186370098 @default.
• W2331717731 hasConcept C18762648 @default.
• W2331717731 hasConcept C192562407 @default.
• W2331717731 hasConcept C198291218 @default.
• W2331717731 hasConcept C2524010 @default.
• W2331717731 hasConcept C2779244869 @default.
• W2331717731 hasConcept C30475298 @default.
• W2331717731 hasConcept C33923547 @default.
• W2331717731 hasConcept C4839761 @default.
• W2331717731 hasConcept C54516573 @default.
• W2331717731 hasConcept C62520636 @default.
• W2331717731 hasConcept C97355855 @default.
• W2331717731 hasConcept C99844830 @default.
• W2331717731 hasConceptScore W2331717731C120665830 @default.

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