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• W2340466105 abstract "Abstract We demonstrate that a bilayer heterostructure, comprised of a tetragonal (T) 0.7[Ba(Zr 0.2 Ti 0.8 )O 3 ]−0.3(Ba 0.7 Ca 0.3 TiO 3 ) (0.7BZT-0.3BCT) film deposited on a rhombohedral (R) 0.3[Ba(Zr 0.2 Ti 0.8 )O 3 ]−0.7(Ba 0.7 Ca 0.3 TiO 3 ) (0.3BZT-0.7BCT)film, on Pt/Ti/SiO 2 /Si substrates leads to a significant enhancement in piezoelectric properties. The observed enhancement in the piezoelectric properties could be attributed to that ferroelectric domains are tethered only by a soft R under layer, and not by the hard substrate. The piezoelectric constant is approximately 120 pm/V for the bilayer thin films, which is two orders of magnitude larger than what is observed in constrained single-layered 0.7BZT-0.3BCT thin films. Such tailoring of piezoelectric behaviors is very attractive for a variety of electromechanical devices." @default.
• W2340466105 created "2016-06-24" @default.
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• W2340466105 date "2016-08-01" @default.
• W2340466105 modified "2023-10-15" @default.
• W2340466105 title "Piezoelectric properties of bilayer ferroelectric thin films based on (1−x)[Ba(Zr0.2Ti0.8)O3] –x(Ba0.7Ca0.3TiO3)" @default.
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• W2340466105 doi "https://doi.org/10.1016/j.matlet.2016.04.154" @default.
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