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- W2348980922 abstract "New design idea brings new technology revolution.Scanning Probe Microscope(STM)uses the methods of close probe detection,the theory of tunnel current and the technology of piezoelectricity chinaware to improve the proˉfundity of electro-microscope.By using the method of STM,many new microscopy instruments and detection methods have been developed.These instruments are used in various regions and have different functions.Although they have different functions but they have the same peculiarity of using the probe to scan the surface of sample.Scientists induce all these instruments together and call them Scanning Probe Microscope.This paper discusses the features and characˉteristics of the family members of SPM such as atomic force microscope,close field optic microscope and trajectory electron emission microscope." @default.
- W2348980922 created "2016-06-24" @default.
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- W2348980922 date "2005-01-01" @default.
- W2348980922 modified "2023-10-18" @default.
- W2348980922 title "An overview of scanning probe microscope" @default.
- W2348980922 hasPublicationYear "2005" @default.
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