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- W2352044434 abstract "The irradiation and postirradiation response of LH4007RHA CMOS device is investigated as a function of radiation total dose and dose rate of ~(60)Co γ rays,and annealing time and temperature.According to the result,on the basis of MIL-STD 883C,Test Method 1019.4.~(60)Co irradiation plus 25℃ annealing can provide an estimate of the effects of oxide-trip charge on MOS device response in space that is significantly less conservative than MIL-STD 883C,Test Method 1019.4.To screen against interface-trap related failures,one-week 100℃ high-temperature anneal is proposed." @default.
- W2352044434 created "2016-06-24" @default.
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- W2352044434 date "2006-01-01" @default.
- W2352044434 modified "2023-09-25" @default.
- W2352044434 title "Test and research on estimating method of total dose irradiation at laboratory environment for CMOS space electronics" @default.
- W2352044434 hasPublicationYear "2006" @default.
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