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- W2353032411 abstract "The analysis process and methods of failure chip capacitors were introduced by a failure analysis case for an actual chip capacitor with visual inspection, cross section analysis and SEM and EDS analysis . The analysis results show that the crack existed parallel resistance characteristic in ceramic dielectric materials between inner two electrodes is main reason for the capacitor current leakage failure. The crack belongs fabricating defect. Failure analysis possesses quality control action for chip capacitor manufacture process." @default.
- W2353032411 created "2016-06-24" @default.
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- W2353032411 date "2008-01-01" @default.
- W2353032411 modified "2023-09-26" @default.
- W2353032411 title "Failure analysis for the chip capacitor" @default.
- W2353032411 hasPublicationYear "2008" @default.
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