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- W2355306400 abstract "The working principles of X-ray diffraction(XRD),scanning tunneling microscopy(STM),atomic force microscope(AFM),scanning probe microscopy(SPM) are introduced.The application and development of these technologies in the analysis of the structure and properties of nano-particles are also discussed." @default.
- W2355306400 created "2016-06-24" @default.
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- W2355306400 date "2008-01-01" @default.
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- W2355306400 title "Review of modern analytical technologies for nano-materials" @default.
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