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- W2356146981 abstract "The phenomenon,construction,mechanism and causes of CMOS circuit latch resulted from testing instrument induction leakage are analyzed in this paper,based on the failure of CMOS driven gate in modulating process of a ma- chine.It is very typical." @default.
- W2356146981 created "2016-06-24" @default.
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- W2356146981 date "2002-01-01" @default.
- W2356146981 modified "2023-09-26" @default.
- W2356146981 title "CMOS Circuit Latch Resulted from Leakage of Instrument" @default.
- W2356146981 hasPublicationYear "2002" @default.
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