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- W2356553002 abstract "Plant height, ear elongation stage, disease resistance, spike types and yield characters were investigated in M_3 progenies of wheat cultivar CH3286 implanted by low energy N~+ ion beam with different dosages (E=30?kev). Cytological mechanism of trait variance induced by implantation of N~+ ion was analyzed in M_1 progenies. The results show that agronomical trait variances induced by implantation of N~+ ion beam are mainly plant height, ear elongation stage, spike types and yield traits. But disease resistance can not be improved. Grains weight per plant and grain numbers per plant are significantly increased (F=0.05) and TKW significantly decreased (F=0.01) in the N~+ ion treatment. Spike length, spike neck length, flag leaf length, and spikelets per spike are not changed. Meiotic behavior of M_1 progenies is properly abnormal due to implantation of N~+ ion beam. Compared with wheat plants not treated by low energy N~+ ion beam, meiotic pairing frequency is decreased and univalent frequency is increased in metaphase cell. Ring univalent, chromosome arm and multivalent are observed in this duration. More chromosome aberrance types including chromosome fragments and bridges, micronucleus and tagged chromosomes are investigated in anaphase and telophase, in which chromosome fragments and micronucleus are found in the most of PMCs. The degree of meiotic irregularities is positively increased with implanted dosage." @default.
- W2356553002 created "2016-06-24" @default.
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- W2356553002 date "2005-01-01" @default.
- W2356553002 modified "2023-09-25" @default.
- W2356553002 title "Cytological Mechanism of Trait Variance Induced by Low Energy N~+ Ion Beam in Common Wheat" @default.
- W2356553002 hasPublicationYear "2005" @default.
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