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- W2358903517 abstract "To mitigate the effect of single event upset (SEU), EDAC technology is often applied on on-board computer RAM. This paper presents the principle of EDAC, and improves the EDAC circuit by the use of single SRAM for data and parity storage, thus saving PCB areas, reducing costs. Finally a method of verifying the EDAC function is proposed." @default.
- W2358903517 created "2016-06-24" @default.
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- W2358903517 date "2011-01-01" @default.
- W2358903517 modified "2023-09-23" @default.
- W2358903517 title "The Design Of An EDAC Circuit Based On Single SRAM" @default.
- W2358903517 hasPublicationYear "2011" @default.
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