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- W2358928265 abstract "Accelerated stress test is one of the most important approaches to evaluating storage reliability of semiconductor devices in long-term storage.Proper and accurate accelerated stress models were necessary for quantitative analysis on storage life of semiconductor devices.Main failure mechanisms and corresponding accelerated stress models for long-term storage of semiconductor devices were reviewed,and compatible conditions for accelerated stress models were discussed." @default.
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- W2358928265 date "2013-01-01" @default.
- W2358928265 modified "2023-09-25" @default.
- W2358928265 title "Long-Term Storage Failure Mechanism of Semiconductor Devices and Their Accelerated Modeling" @default.
- W2358928265 hasPublicationYear "2013" @default.
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