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- W2360985367 abstract "Erbium ions play a very important role in optical telecommunication developing.The erbium ions were doped into KTiOPO4 crystals by ion implantation.The Rutherford backscattering technique was used to analyze the depth profile of erbium ions in the KTiOPO4 crystals.The erbium doped KTiOPO4 crystals were annealed.The depth profile of erbium ions in annealed KTiOPO4 crystals were no longer Gaussian distributions,the two peaks is distributed.The results provide important information for the lattice defects and damage distribution." @default.
- W2360985367 created "2016-06-24" @default.
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- W2360985367 date "2010-01-01" @default.
- W2360985367 modified "2023-09-24" @default.
- W2360985367 title "Rutherford Backscattering Study on Erbium Implanted KTiOPO_4 Crystals" @default.
- W2360985367 hasPublicationYear "2010" @default.
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