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- W2361921657 abstract "In order to investigate the influence of impurities with high positron affinity on the defects depth distribution of positron annihilation measurement,Samples of Mo which implanted with different metal ions were probed by slow positron beam. The results show that defects profiles obtained by positron measurements were deeper than those by SRIM simulation,which demonstrate the defects are easy to spread. The maximum S value depth of Cu+implantation( 150 nm) is greater than that of Mo+implantation( 125 nm),which is caused by the positrons are easier trapped by Cu impurities clusters than Mo vacancy clusters. The Cu clusters positron trapping will effect the measurement of defects depth distribution by slow positron beam." @default.
- W2361921657 created "2016-06-24" @default.
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- W2361921657 date "2015-01-01" @default.
- W2361921657 modified "2023-09-23" @default.
- W2361921657 title "Positron Affinity of Impurities Effect on the Defects Distribution of Slow Positron Beam Measurement" @default.
- W2361921657 hasPublicationYear "2015" @default.
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