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- W2362257102 abstract "The structure of OLED was studied by NK analyzer and the reflectance spectrum of samples in different time duration were compared.The layers thickness information in this OLED,with a structure of ITO/NPB/Alq3/LiF/Al,can be obtained by calculating and datum fitting.By comparing the structure of different samples,it is found that the main reason of device failure lies in Alq3 and LiF layer.This also indicates that NK analysis is an effective method for OLED failure research." @default.
- W2362257102 created "2016-06-24" @default.
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- W2362257102 date "2010-01-01" @default.
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- W2362257102 title "N & K Analyzer in OLED Failure Analysis" @default.
- W2362257102 hasPublicationYear "2010" @default.
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