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- W2364006614 abstract "Two pieces of high purity InP sample extracted from the same wafer are examined by positron annihilation spectrum analysis after having been processed by means of thermal nectron transmutation(NTD).The low temperature experiment after the annealing of InP shows that there is an abnormal reduction of average lifetime with increasing temperature.And a low temperature experiment on an n-type InP(Sn) sample doped by traditional method exhibits the same phenomenon.The mechanism of this phenomenon is analyzed as well as the results of the annealing experiment." @default.
- W2364006614 created "2016-06-24" @default.
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- W2364006614 date "1999-01-01" @default.
- W2364006614 modified "2023-09-23" @default.
- W2364006614 title "Study on defects in NTD InP using positron annihiation spectroscopy" @default.
- W2364006614 hasPublicationYear "1999" @default.
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