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- W2364362910 abstract "Using End-Hall ion source, the application of ion beam cleaning on the laser films is investigated. The re-contaminated phenomenon and ion cleaning effect are proved by experiments, and the modification of the substrate surface topography is observed. The effect of ion beam cleaning on the laser films is investigated. The mechanics of substrate surface characteristics modification, for example cleanness, surface energy, contact angle, and surface topography are analysed. It is concluded that the removal of impurity and the enhanced adhesion are contributed to the increase of laser-induced damage thresholds of films." @default.
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- W2364362910 date "2005-01-01" @default.
- W2364362910 modified "2023-09-25" @default.
- W2364362910 title "The application of ion beam cleaning on the laser films" @default.
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