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- W2364822588 abstract "The problem of selecting the optimum test points of analog circuits is considered.The test point essential degree is proposed to identify how the test point is needed.Then combined with fault isolation degree,a new test point selection method is presented.The detailed calculating process of the new algorithm is given and two examples are proposed.The experiment results show that the new algorithm is better than entropy algorithm and the algorithm based on fault isolation degree,and can be applied to test point selection for complicated analog circuits." @default.
- W2364822588 created "2016-06-24" @default.
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- W2364822588 date "2011-01-01" @default.
- W2364822588 modified "2023-09-23" @default.
- W2364822588 title "Test point selection method for analog circuits based on essential degree" @default.
- W2364822588 hasPublicationYear "2011" @default.
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