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- W2366028128 abstract "In this paper, the characteristic of the microwave power device and its influence on the breakdown voltage are analyzed. Based on this analysis, the methods of Diffused Guard Ring and Depletion Etching are used to raise the breakdown voltage. Finally, by calculating correlated parameters, we make a C-band 20W power transistor with breakdown voltage of 55V on a substrate whose density and thickness are 9×1015cm-3 and 3 μm." @default.
- W2366028128 created "2016-06-24" @default.
- W2366028128 creator A5026352710 @default.
- W2366028128 date "2007-01-01" @default.
- W2366028128 modified "2023-09-23" @default.
- W2366028128 title "Simulation of the Breakdown Voltage of Power Devices" @default.
- W2366028128 hasPublicationYear "2007" @default.
- W2366028128 type Work @default.
- W2366028128 sameAs 2366028128 @default.
- W2366028128 citedByCount "0" @default.
- W2366028128 crossrefType "journal-article" @default.
- W2366028128 hasAuthorship W2366028128A5026352710 @default.
- W2366028128 hasConcept C119321828 @default.
- W2366028128 hasConcept C119599485 @default.
- W2366028128 hasConcept C121332964 @default.
- W2366028128 hasConcept C127413603 @default.
- W2366028128 hasConcept C129014197 @default.
- W2366028128 hasConcept C163258240 @default.
- W2366028128 hasConcept C165801399 @default.
- W2366028128 hasConcept C172385210 @default.
- W2366028128 hasConcept C192562407 @default.
- W2366028128 hasConcept C2986567525 @default.
- W2366028128 hasConcept C41008148 @default.
- W2366028128 hasConcept C44838205 @default.
- W2366028128 hasConcept C49040817 @default.
- W2366028128 hasConcept C62520636 @default.
- W2366028128 hasConcept C76155785 @default.
- W2366028128 hasConceptScore W2366028128C119321828 @default.
- W2366028128 hasConceptScore W2366028128C119599485 @default.
- W2366028128 hasConceptScore W2366028128C121332964 @default.
- W2366028128 hasConceptScore W2366028128C127413603 @default.
- W2366028128 hasConceptScore W2366028128C129014197 @default.
- W2366028128 hasConceptScore W2366028128C163258240 @default.
- W2366028128 hasConceptScore W2366028128C165801399 @default.
- W2366028128 hasConceptScore W2366028128C172385210 @default.
- W2366028128 hasConceptScore W2366028128C192562407 @default.
- W2366028128 hasConceptScore W2366028128C2986567525 @default.
- W2366028128 hasConceptScore W2366028128C41008148 @default.
- W2366028128 hasConceptScore W2366028128C44838205 @default.
- W2366028128 hasConceptScore W2366028128C49040817 @default.
- W2366028128 hasConceptScore W2366028128C62520636 @default.
- W2366028128 hasConceptScore W2366028128C76155785 @default.
- W2366028128 hasLocation W23660281281 @default.
- W2366028128 hasOpenAccess W2366028128 @default.
- W2366028128 hasPrimaryLocation W23660281281 @default.
- W2366028128 hasRelatedWork W1564728342 @default.
- W2366028128 hasRelatedWork W1973789179 @default.
- W2366028128 hasRelatedWork W1998255460 @default.
- W2366028128 hasRelatedWork W2000589314 @default.
- W2366028128 hasRelatedWork W2011156157 @default.
- W2366028128 hasRelatedWork W2034581455 @default.
- W2366028128 hasRelatedWork W2049738812 @default.
- W2366028128 hasRelatedWork W2056322627 @default.
- W2366028128 hasRelatedWork W2077614292 @default.
- W2366028128 hasRelatedWork W2094109492 @default.
- W2366028128 hasRelatedWork W2112149602 @default.
- W2366028128 hasRelatedWork W2122511806 @default.
- W2366028128 hasRelatedWork W2199715576 @default.
- W2366028128 hasRelatedWork W2349697166 @default.
- W2366028128 hasRelatedWork W2380026876 @default.
- W2366028128 hasRelatedWork W2382676921 @default.
- W2366028128 hasRelatedWork W2394468862 @default.
- W2366028128 hasRelatedWork W2533865069 @default.
- W2366028128 hasRelatedWork W2755344737 @default.
- W2366028128 hasRelatedWork W2085613001 @default.
- W2366028128 isParatext "false" @default.
- W2366028128 isRetracted "false" @default.
- W2366028128 magId "2366028128" @default.
- W2366028128 workType "article" @default.