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- W2366692454 abstract "A new algorithm for automatic test pattern generation (ATPG) of sequential circuit is proposed. Conventional ATPG algorithms adopt partial state transition graph or collect knowledge and rules extracted from circuit in gate level to solve the difficulty of automatic test pattern generation for sequential circuit. The new algorithm focuses on the redundancy of computing with a brand new model. Based on ant path model, forward sensitising is reconstructed, both forward propagation and backtrace process are mixed into a single path, in which lots of the detected faults may be widely scattered, so that lots of computing redundancy conduced by searching repetition in other ATPG algorithm of sequential circuit are saved. Meanwhile it is assured by theorems that vector compaction is minimized. Finally, compared with integrity linear programming by benchmark circuits, the algorithm is proved to be faster in speed with the same fault coverage." @default.
- W2366692454 created "2016-06-24" @default.
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- W2366692454 date "2003-01-01" @default.
- W2366692454 modified "2023-09-25" @default.
- W2366692454 title "Ant Path Searching Algorithm for Automatic Test Pattern Generation of Sequential Circuit" @default.
- W2366692454 hasPublicationYear "2003" @default.
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