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- W2369621899 abstract "A new test generation algorithm for combinational circuits based on improved particle swarm optimization that is using the improved particle swarm optimization and fault simulation to generate test patterns of combinational circuits.The experimental results on some circuits demonstrate the method has higher fault coverage and shorter test time." @default.
- W2369621899 created "2016-06-24" @default.
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- W2369621899 date "2006-01-01" @default.
- W2369621899 modified "2023-09-23" @default.
- W2369621899 title "A New Method of Test Generation for Combinational Circuits" @default.
- W2369621899 hasPublicationYear "2006" @default.
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