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- W2371297503 abstract "The ion-bombardment nicks of M-type dispenser cathodes have been analyzed with scan electron microscope and X ray energy spectrum.The results indicate that the noble metal film(Os film) in the centre of the ion-bombardment nicks had been completely sputtered off already,and a part of the film surrounding the ion-bombardment nick was still remained,with an extremely lower content of Ba and O.Analyses further indicate that the ion bombardment not only makes the regional noble metal film damaged,but also makes the content of this regional Ba-O bond reduce by a large margin at the same time,thus lead to the fact that the obvious decline has appeared in the emission of this area and the whole cathode." @default.
- W2371297503 created "2016-06-24" @default.
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- W2371297503 date "2007-01-01" @default.
- W2371297503 modified "2023-09-23" @default.
- W2371297503 title "SEM Analysis of Ion-Bombardment Nicks of M-Type Dispenser Cathodes" @default.
- W2371297503 hasPublicationYear "2007" @default.
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