Matches in SemOpenAlex for { <https://semopenalex.org/work/W2371784983> ?p ?o ?g. }
Showing items 1 to 63 of
63
with 100 items per page.
- W2371784983 abstract "Built-in self-test (BIST) is considered as an efficient approach for embedded memories testing.This paper gives a survey on the up-to-date development of research in this field.It begins with an overview of conventional fault models for memories so far.The inductive fault analysis approach and some new fault models such as read disturb fault and incorrect read fault are discussed.The typical BIST schemes for embedded memories are analyzed.The feasibility of adding built-in redundancy analysis,built-in self-diagnosis and built-in self-repair into BIST circuits is analyzed." @default.
- W2371784983 created "2016-06-24" @default.
- W2371784983 creator A5072175419 @default.
- W2371784983 date "2004-01-01" @default.
- W2371784983 modified "2023-09-28" @default.
- W2371784983 title "Survey on Built-in Self-test and Built-in Self-repair of Embedded Memories" @default.
- W2371784983 hasPublicationYear "2004" @default.
- W2371784983 type Work @default.
- W2371784983 sameAs 2371784983 @default.
- W2371784983 citedByCount "0" @default.
- W2371784983 crossrefType "journal-article" @default.
- W2371784983 hasAuthorship W2371784983A5072175419 @default.
- W2371784983 hasConcept C119599485 @default.
- W2371784983 hasConcept C126953365 @default.
- W2371784983 hasConcept C127313418 @default.
- W2371784983 hasConcept C127413603 @default.
- W2371784983 hasConcept C134146338 @default.
- W2371784983 hasConcept C149635348 @default.
- W2371784983 hasConcept C152124472 @default.
- W2371784983 hasConcept C165205528 @default.
- W2371784983 hasConcept C175551986 @default.
- W2371784983 hasConcept C200601418 @default.
- W2371784983 hasConcept C2780980493 @default.
- W2371784983 hasConcept C41008148 @default.
- W2371784983 hasConceptScore W2371784983C119599485 @default.
- W2371784983 hasConceptScore W2371784983C126953365 @default.
- W2371784983 hasConceptScore W2371784983C127313418 @default.
- W2371784983 hasConceptScore W2371784983C127413603 @default.
- W2371784983 hasConceptScore W2371784983C134146338 @default.
- W2371784983 hasConceptScore W2371784983C149635348 @default.
- W2371784983 hasConceptScore W2371784983C152124472 @default.
- W2371784983 hasConceptScore W2371784983C165205528 @default.
- W2371784983 hasConceptScore W2371784983C175551986 @default.
- W2371784983 hasConceptScore W2371784983C200601418 @default.
- W2371784983 hasConceptScore W2371784983C2780980493 @default.
- W2371784983 hasConceptScore W2371784983C41008148 @default.
- W2371784983 hasLocation W23717849831 @default.
- W2371784983 hasOpenAccess W2371784983 @default.
- W2371784983 hasPrimaryLocation W23717849831 @default.
- W2371784983 hasRelatedWork W1524724240 @default.
- W2371784983 hasRelatedWork W1583811450 @default.
- W2371784983 hasRelatedWork W1623282014 @default.
- W2371784983 hasRelatedWork W1769210942 @default.
- W2371784983 hasRelatedWork W1848988333 @default.
- W2371784983 hasRelatedWork W1909747176 @default.
- W2371784983 hasRelatedWork W2092698072 @default.
- W2371784983 hasRelatedWork W2097266523 @default.
- W2371784983 hasRelatedWork W2098021146 @default.
- W2371784983 hasRelatedWork W2100287799 @default.
- W2371784983 hasRelatedWork W2110049876 @default.
- W2371784983 hasRelatedWork W2114424039 @default.
- W2371784983 hasRelatedWork W2143507563 @default.
- W2371784983 hasRelatedWork W2144516253 @default.
- W2371784983 hasRelatedWork W2145644328 @default.
- W2371784983 hasRelatedWork W2154260879 @default.
- W2371784983 hasRelatedWork W2159640102 @default.
- W2371784983 hasRelatedWork W2164475427 @default.
- W2371784983 hasRelatedWork W2478679151 @default.
- W2371784983 hasRelatedWork W2543339660 @default.
- W2371784983 isParatext "false" @default.
- W2371784983 isRetracted "false" @default.
- W2371784983 magId "2371784983" @default.
- W2371784983 workType "article" @default.