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- W2372519097 abstract "The failure rate is an important indicator to develop maintenance strategies. We established a transformer failure model based on semi-Markov process to analyze the failure rate. The model involves thermal aging process and random failure process. The thermal aging process is divided into four states based on average polymerization degree of insulating paper. The transition time between the states of thermal aging process is assumed to obey the Weibull distribution, and the average transition time is obtained by empirical formula. The random failure process includes random failures caused by lightning strikes or short circuits shocks. The transition time between normal state and random failure state is assumed to be exponentially distributed, and the transition rate is obtained through failure statistics. With the variation of the shape parameter of the Weibull distribution, a reasonable failure rate curve can be acquired by the transformer failure model presented. The conclusion can be drawn that the semi-Markov failure model for transformers considering both thermal aging and random failure processes can better reflect the actual transformer failure mechanisms." @default.
- W2372519097 created "2016-06-24" @default.
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- W2372519097 date "2015-01-01" @default.
- W2372519097 modified "2023-09-26" @default.
- W2372519097 title "Failure Rate Analysis of Transformers Based on Semi-Markov Process" @default.
- W2372519097 hasPublicationYear "2015" @default.
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