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- W2372845385 abstract "The pyramid structure change on the surface of the monocrystalline silicon textured by different alkaline solutions( NaOH,Na 2 CO 3,NaHCO 3,Na 2 SiO 3,Ca( OH) 2,CH 3 COONa) and isopropyl alcohol( IPA) were studied. The surface reflectance was measured by spectrophotometer. The results show that the reflectance of the pyramidal structure is related to the pyramid shape and distribution. The lowest reflectance is 7. 8% in the experiment. The cross-section SEM image show that the apex angle of the pyramidal structure maintained around 80° and did not obviously depended on the reaction condition and the size of pyramid. By analysis the relationship between textured silicon surface( SEM images) and its corresponding reflectance,the concept of texturing ratio α and average reflectance R α were proposed, which can quickly test the texturing ratio of monocrystalline silicon." @default.
- W2372845385 created "2016-06-24" @default.
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- W2372845385 date "2014-01-01" @default.
- W2372845385 modified "2023-09-23" @default.
- W2372845385 title "Study on the Property and Texturing of Monocrystalline Silicon Surface" @default.
- W2372845385 hasPublicationYear "2014" @default.
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