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- W2372991027 abstract "Minority carrier lifetime is an important parameter for PIN diodes. It determines the voltage drop in forward conduction and switching time. This paper introduces the commonly used methods of measuring minority carrier lifetime, including the open circuit voltage decay, the step reverse recovery, the ramp recovery, stored charge and RF technique for determining carrier lifetime. It also analyses the advantage and disadvantage of every method. The step reverse recovery and the ramp recovery are emphasized. This paper is useful for measuring minority carrier lifetime in practice." @default.
- W2372991027 created "2016-06-24" @default.
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- W2372991027 date "2004-01-01" @default.
- W2372991027 modified "2023-09-23" @default.
- W2372991027 title "Measurements for Minority Lifetime in PIN Diodes" @default.
- W2372991027 hasPublicationYear "2004" @default.
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