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- W2375755517 abstract "Defects in CdSe crystal were investigated with Positron Annihilation Technology (PAT). Tests and analyses of the positron annihilation lifetime on annealing samples at different temperature demonstrated that point defects were mainly cadmium vacancies which were preponderant in CdSe crystal. Meanwhile, the mobile character, combination and disappearing process of the vacancies were discussed in accordance with relationships between positron annihilation lifetime and different annealing temperature. Optimal annealing temperature is in the range of 650～800?℃.In this temperature range, the concentration of vacancy-type defects will decrease and integrated crystal lattice will be obtained." @default.
- W2375755517 created "2016-06-24" @default.
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- W2375755517 date "2004-01-01" @default.
- W2375755517 modified "2023-09-24" @default.
- W2375755517 title "Studies of the Positron Annihilation Lifetime in CdSe Crystal" @default.
- W2375755517 hasPublicationYear "2004" @default.
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