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- W2376659324 abstract "Transient current testing(IDDT) has been often cited as an alternative or supplement to IDDQ testing,especially in deep-submicro technologies,such test technique is noticed by more and more researchers.An off-chip and charge-based transient current monitor circuit is presented.On the basis of it,the circuits is improved and simulated for second Domino parallel circuits,experimental results show that the circuit can effectively sense transient current of integrated circuit and hence,perform transient current testing." @default.
- W2376659324 created "2016-06-24" @default.
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- W2376659324 date "2008-01-01" @default.
- W2376659324 modified "2023-09-26" @default.
- W2376659324 title "Off-chip Transient Current Monitor Circuit of CMOS Integrated Circuit" @default.
- W2376659324 hasPublicationYear "2008" @default.
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