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- W2386117891 abstract "The degradation of power gain, saturation voltage drop and reverse breakdown voltage of EB junction in the application of the silicon microwave pulsed power transistor was introduced, and the degradation phenomenon is the focus of the research. In this experiment, the forward characteristics and C-V characteristics of EB junction of both good products and defect products were tested. By comparing and analyzing their differences, we theoretically derived one of the most important reasons for the degradation——the decrease of the concentration and concentration gradient in the base region. It is shown that the rediffusion of impurity occurred in the device operated at high temperature for a long time could cause the changes of concentration in the base region." @default.
- W2386117891 created "2016-06-24" @default.
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- W2386117891 date "2009-01-01" @default.
- W2386117891 modified "2023-09-25" @default.
- W2386117891 title "Study on the Parameter Degradation of Silicon Microwave Pulsed Power Transistor" @default.
- W2386117891 hasPublicationYear "2009" @default.
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