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- W2388014780 abstract "Backscattered electron imaging and analysis(BSE-IA) is invaluable in cement research due to its ability of qualitative and quantitative analysis.For BSE-IA,polished specimens of cement pastes should be prepared first.The accuracy of BSE-IA is mainly determined by the quality of flat-polished specimens.The requirements for quanlified flat-polished specimens and its effect on the BSE-IA were described.In addition,some factors influencing the epoxy intrusion depth aiming at slag cement paste were investigated.It was showed that epoxy intrusion played a key role in preparing qualified specimens since without epoxy filling other defects existed meanwhile such as particles fall-off,low planness.The use of appropriate measurements could improve the epoxy intrusion." @default.
- W2388014780 created "2016-06-24" @default.
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- W2388014780 date "2013-01-01" @default.
- W2388014780 modified "2023-09-23" @default.
- W2388014780 title "Preparation of Flat-polished Specimens of Cement Paste for Backscattered Electron Imaging and Analysis" @default.
- W2388014780 hasPublicationYear "2013" @default.
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