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- W2392765143 abstract "A new approach to evaluate the reliability of vacuum electron display divices is introduced,based on the reliability data form other CRT manufacturing process including both technology and materials.According to the failure rate model and theory of reliability,a calculating model for evaluating reliability of CRT can be deduced with the help of a multivariate regression analysis in mathematical statistics.Then,the relationship between the failure rate of CRT and other key factors,such as technology and materials can be investigated." @default.
- W2392765143 created "2016-06-24" @default.
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- W2392765143 date "1999-01-01" @default.
- W2392765143 modified "2023-09-24" @default.
- W2392765143 title "Application Investigation on the Reliablity Evaluation Method of Vacuum Electron Display Devices" @default.
- W2392765143 hasPublicationYear "1999" @default.
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