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- W2393168785 abstract "At first,the application of machine vision based on virtual instrument in industrial inspection is introduced. Based on the virtual instrument,the platform of inspection system has been established and the hardware components are described. Secondly,according to the characteristics of the capacitor defects,the image processing algorithms of sparse median filter,mixed transformation functions and global threshold segmentation are proposed. At last,a defect detection system for capacitors is developed based on LabVIEW which can detect the defects rapidly and robustly from captured capacitor images. Theoretical research and experimental work has proved that the methods discussed in this paper are effective and valuable for defect inspection." @default.
- W2393168785 created "2016-06-24" @default.
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- W2393168785 date "2014-01-01" @default.
- W2393168785 modified "2023-09-22" @default.
- W2393168785 title "Research on Defect Detection System for Capacitor Based on LabVIEW" @default.
- W2393168785 hasPublicationYear "2014" @default.
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