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• W2399589732 abstract "In this chapter fault models used to model the effects of defects causing excessive circuit delays are discussed. Methods to generate tests to detect modeled faults and design for test methods to improve fault coverage are reviewed. Current work in detecting what are called small delay defects is discussed." @default.
• W2399589732 created "2016-06-24" @default.
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• W2399589732 date "2010-01-01" @default.
• W2399589732 modified "2023-09-23" @default.
• W2399589732 title "Chapter 3 Models for Delay Faults" @default.
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