Matches in SemOpenAlex for { <https://semopenalex.org/work/W2400287769> ?p ?o ?g. }
Showing items 1 to 77 of
77
with 100 items per page.
- W2400287769 endingPage "100" @default.
- W2400287769 startingPage "94" @default.
- W2400287769 abstract "As the use of automatic handling equipment for sensitive semiconductor devices is rapidly increased, manufacturers of electronic components and equipments need to be more alert to the problem of electrostatic discharges(ESD). In order to analyze damage characteristics of semiconductor device damaged by ESD, this study adopts a new charged-device model(CDM), field-induced charged model(FCDM) simulator that is suitable for rapid, routine testing of semiconductor devices and provides a fast and inexpensive test that faithfully represents ESD hazards in plants. High voltage applied to the device under test is raised by the field of non-contacting electrodes in the FCDM simulator, which avoids premature device stressing and permits a faster test cycle. Discharge current and time are measured and calculated. The characteristics of electrostatic attenuation of domestic semiconductor devices are investigated to evaluate the ESD phenomena in the semiconductors. Also, the field charging mechanism, the device thresholds and failure modes are investigated and analyzed. The damaged devices obtained in the simulator are analyzed and evaluated by SEM. The results obtained in this paper can be used to prevent semiconductor devices form ESD hazards and be a foundation of research area and industry relevant to ESD phenomena." @default.
- W2400287769 created "2016-06-24" @default.
- W2400287769 creator A5019936971 @default.
- W2400287769 creator A5043071774 @default.
- W2400287769 creator A5073073606 @default.
- W2400287769 date "2002-01-01" @default.
- W2400287769 modified "2023-09-28" @default.
- W2400287769 title "Experimental Investigation of the Electrostatic Discharge(ESD) Damage in Packaged Semiconductor Devices" @default.
- W2400287769 hasPublicationYear "2002" @default.
- W2400287769 type Work @default.
- W2400287769 sameAs 2400287769 @default.
- W2400287769 citedByCount "0" @default.
- W2400287769 crossrefType "journal-article" @default.
- W2400287769 hasAuthorship W2400287769A5019936971 @default.
- W2400287769 hasAuthorship W2400287769A5043071774 @default.
- W2400287769 hasAuthorship W2400287769A5073073606 @default.
- W2400287769 hasConcept C108225325 @default.
- W2400287769 hasConcept C119599485 @default.
- W2400287769 hasConcept C127413603 @default.
- W2400287769 hasConcept C138331895 @default.
- W2400287769 hasConcept C165801399 @default.
- W2400287769 hasConcept C171250308 @default.
- W2400287769 hasConcept C192562407 @default.
- W2400287769 hasConcept C195266298 @default.
- W2400287769 hasConcept C202444582 @default.
- W2400287769 hasConcept C205483674 @default.
- W2400287769 hasConcept C2779227376 @default.
- W2400287769 hasConcept C33923547 @default.
- W2400287769 hasConcept C76249512 @default.
- W2400287769 hasConcept C79635011 @default.
- W2400287769 hasConcept C9652623 @default.
- W2400287769 hasConceptScore W2400287769C108225325 @default.
- W2400287769 hasConceptScore W2400287769C119599485 @default.
- W2400287769 hasConceptScore W2400287769C127413603 @default.
- W2400287769 hasConceptScore W2400287769C138331895 @default.
- W2400287769 hasConceptScore W2400287769C165801399 @default.
- W2400287769 hasConceptScore W2400287769C171250308 @default.
- W2400287769 hasConceptScore W2400287769C192562407 @default.
- W2400287769 hasConceptScore W2400287769C195266298 @default.
- W2400287769 hasConceptScore W2400287769C202444582 @default.
- W2400287769 hasConceptScore W2400287769C205483674 @default.
- W2400287769 hasConceptScore W2400287769C2779227376 @default.
- W2400287769 hasConceptScore W2400287769C33923547 @default.
- W2400287769 hasConceptScore W2400287769C76249512 @default.
- W2400287769 hasConceptScore W2400287769C79635011 @default.
- W2400287769 hasConceptScore W2400287769C9652623 @default.
- W2400287769 hasIssue "4" @default.
- W2400287769 hasLocation W24002877691 @default.
- W2400287769 hasOpenAccess W2400287769 @default.
- W2400287769 hasPrimaryLocation W24002877691 @default.
- W2400287769 hasRelatedWork W1485292468 @default.
- W2400287769 hasRelatedWork W2022962534 @default.
- W2400287769 hasRelatedWork W2035883040 @default.
- W2400287769 hasRelatedWork W2048895532 @default.
- W2400287769 hasRelatedWork W2081531051 @default.
- W2400287769 hasRelatedWork W2089001542 @default.
- W2400287769 hasRelatedWork W2093486454 @default.
- W2400287769 hasRelatedWork W2118688785 @default.
- W2400287769 hasRelatedWork W2131638024 @default.
- W2400287769 hasRelatedWork W2164343604 @default.
- W2400287769 hasRelatedWork W2164639390 @default.
- W2400287769 hasRelatedWork W2337647905 @default.
- W2400287769 hasRelatedWork W2387067661 @default.
- W2400287769 hasRelatedWork W2536325511 @default.
- W2400287769 hasRelatedWork W3145039865 @default.
- W2400287769 hasRelatedWork W3146054442 @default.
- W2400287769 hasRelatedWork W58072275 @default.
- W2400287769 hasRelatedWork W2067282271 @default.
- W2400287769 hasRelatedWork W2299418491 @default.
- W2400287769 hasRelatedWork W2417192496 @default.
- W2400287769 hasVolume "17" @default.
- W2400287769 isParatext "false" @default.
- W2400287769 isRetracted "false" @default.
- W2400287769 magId "2400287769" @default.
- W2400287769 workType "article" @default.