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• W2405458021 abstract "Charge carrier lifetimes play an important role in determining the efficiency of a solar cell but remain poorly understood in nanocrystal-based devices. Carrier lifetimes are often determined using transient photovoltage measurements. Here, we perform transient photovoltage measurements on PbS nanocrystal-based solar cells and determine that the photovoltage decay time cannot be directly interpreted as the carrier lifetime. We show that the decay time can be modeled as the lifetime of an RC circuit, with the resistive component indicating the degree of trap-assisted Shockley–Read–Hall recombination and capacitive contribution coming from the space charge region. These results provide a model with which transient photovoltage data on nanocrystal devices can be analyzed and used to guide device design." @default.
• W2405458021 created "2016-06-24" @default.
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• W2405458021 date "2016-06-06" @default.
• W2405458021 modified "2023-10-13" @default.
• W2405458021 title "Transient Photovoltage Measurements in Nanocrystal-Based Solar Cells" @default.
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• W2405458021 doi "https://doi.org/10.1021/acs.jpcc.6b03695" @default.
• W2405458021 hasPublicationYear "2016" @default.
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