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- W2414890908 abstract "随着FPGA的发展，FPGA测试技术也得到了相应的发展.因为FPGA的结构和传统专用集成电路(ASIC)有着本质的区别，在FPGA中不能形成可测性设计(DFT)电路，但它的可编程能力决定了其测试电路可以通过编程的方法来实现.本文讨论了用内建自测试(BIST)方法来测试Xilinx Virtex-Ⅱ系列FPGA，只用了10个测试配置能够对FPGA的互连结构达到100％的测试覆盖率。" @default.
- W2414890908 created "2016-06-24" @default.
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- W2414890908 date "2007-01-01" @default.
- W2414890908 modified "2023-09-27" @default.
- W2414890908 title "基于BIST测试Xilinx Virtex-II系列FPGA" @default.
- W2414890908 hasPublicationYear "2007" @default.
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