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- W2415654676 abstract "The FEI NanoEx 3D STM and Electrical Probe is our new TEM specimen holder with a patented Piezo-controller 3D probe for in situ S/TEM imaging and elemental analysis at elevated temperatures.Introduce measurement of contact current, displacement, bias, time, tunneling, and field emission currents to your in situ experiments. STM and electrical probing are conducted with a Piezo probe in this double-tilt holder." @default.
- W2415654676 created "2016-06-24" @default.
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- W2415654676 date "2016-04-18" @default.
- W2415654676 modified "2023-10-17" @default.
- W2415654676 title "NanoEx 3D STM and Electrical Probe" @default.
- W2415654676 hasPublicationYear "2016" @default.
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