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- W2462719167 abstract "Rietveld method [1] has been extensively used as a leading technique for refining structure parameters of a variety of metal and inorganic compounds. severe overlap of reflections in the highQ region (Q =Q = 2π/d; Q: scattering vector, d: lattice-plane spacing) in powder diffraction patterns limits the quality and amount of structural information extractable from them in comparison with singlecrystal data. However, advances in synchrotron X-ray powder diffraction [2] and time-of-flight (TOF) neutron powder diffraction in recent years have enhanced the resolution, ∆d/d, pronouncedly, enabling us to determine very complex structures whose analyses were formerly difficult with powder data. Five years have passed since a Rietveldanalysis program RIETAN [3] was introduced in the wellknown book entitled The Rietveld Method. RIETAN has two versions for angle-dispersive diffraction [3, 4] and TOF neutron diffraction [5]. It has been widely utilized, particularly in Japan, contributing to a large number of structural studies. For example, the structures of the first High-T. superconductors with fluorite and carbonate blocks were solved with RIETAN for TOF neutron diffraction [6]. This article reviews recent advances in RIETAN with a focus on our original technology: partial profile relaxation [7-9] and whole-pattern fitting based on a maximum-entropy method (MEM) [8, 10]." @default.
- W2462719167 created "2016-07-22" @default.
- W2462719167 creator A5021519220 @default.
- W2462719167 date "2000-01-01" @default.
- W2462719167 modified "2023-09-27" @default.
- W2462719167 title "RIETVELD ANALYSIS AND MEM-BASED WHOLE-PATTERN FITTING UNDER PARTIAL PROFILE RELAXATION" @default.
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