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• W2468942035 abstract "OM (optical microscopy) and EBSD (electron backscatter diffraction) techniques were used to study microstructure and texture distribution during primary recrystallization under different intermediate annealing temperatures in CGO silicon steels. The effect of intermediate annealing temperature on texture distribution in 3% Si electrical steel was analyzed. The results indicate that the microstructure in primary recrystallization matrix of CGO silicon steel is comprised of equiaxed ferrite grains. Mean grain size of primary recrystallization increases with the rising of intermediate annealing temperature. γ -fiber texture is the dominant component in primary recrystallization matrix. With higher intermediate annealing temperature,<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML id=M1><mml:mfenced open={ close=} separators=|><mml:mrow><mml:mn fontstyle=italic>111</mml:mn></mml:mrow></mml:mfenced><mml:mfenced open=〈 close=〉 separators=|><mml:mrow><mml:mn fontstyle=italic>121</mml:mn></mml:mrow></mml:mfenced></mml:math>texture and<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML id=M2><mml:mfenced open={ close=} separators=|><mml:mrow><mml:mn fontstyle=italic>111</mml:mn></mml:mrow></mml:mfenced><mml:mfenced open=〈 close=〉 separators=|><mml:mrow><mml:mn fontstyle=italic>110</mml:mn></mml:mrow></mml:mfenced></mml:math>texture increase and<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML id=M3><mml:mfenced open={ close=} separators=|><mml:mrow><mml:mn fontstyle=italic>111</mml:mn></mml:mrow></mml:mfenced><mml:mfenced open=〈 close=〉 separators=|><mml:mrow><mml:mn fontstyle=italic>121</mml:mn></mml:mrow></mml:mfenced></mml:math>texture is stronger than<mml:math xmlns:mml=http://www.w3.org/1998/Math/MathML id=M4><mml:mfenced open={ close=} separators=|><mml:mrow><mml:mn fontstyle=italic>111</mml:mn></mml:mrow></mml:mfenced><mml:mfenced open=〈 close=〉 separators=|><mml:mrow><mml:mn fontstyle=italic>110</mml:mn></mml:mrow></mml:mfenced></mml:math>texture. Goss texture was observed to be decreased firstly and then increased. The content of high angle grain boundaries in primary recrystallization matrix are affected by intermediate annealing temperature. When intermediate annealing temperature is increased, high angle grain boundaries are increased firstly and then decreased. Misorientation distribution in primary recrystallized matrix is affected by primary recrystallization annealing temperature either. The content of high angle grain boundaries are increased owing to higher primary recrystallization annealing temperature, which can be a benefit to the abnormal growth of Goss grains in secondary recrystallization." @default.
• W2468942035 created "2016-07-22" @default.
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• W2468942035 date "2016-01-01" @default.
• W2468942035 modified "2023-09-24" @default.
• W2468942035 title "Influence of Temperature on Typical Texture Distribution in Primary Recrystallization Matrix of 3% Si CGO Silicon Steel" @default.
• W2468942035 cites W1983044755 @default.
• W2468942035 doi "https://doi.org/10.1155/2016/8936805" @default.
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