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- W2473556989 abstract "The authors have determined the rate of electron detachment from sputtered C{sub 60}{sup -} ions (C{sub 60}{sup -} {yields} C{sub 60}{sup 0} + e{sup -}), and correlate that value to the internal energy content of the C{sub 60}{sup -} ions. The experiments was performed with incident atomic ions (9.9 MeV {sup 16}O, 19.7 MeV{sup 32}S, 48.6 MeV{sup 79}Br and 78.2 MeV {sup 127}I) from the Uppsala EN-tandem accelerator. The secondary C{sub 60}{sup -} ions and the neutral species (obtained from the fully accelerated C{sub 60}{sup -} ions during their flight as a result of electron detachment and/or fragmentation) were detected by a micro channel plate detector in the straight mode of a time-of-flight (TOF) spectrometer." @default.
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- W2473556989 date "1994-12-31" @default.
- W2473556989 modified "2023-10-09" @default.
- W2473556989 title "Rates of electron detachment from negatively charged C{sub 60} sputtered by MeV atomic ions" @default.
- W2473556989 hasPublicationYear "1994" @default.
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