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• W2477987695 abstract "In this chapter the reader is introduced to the basic concepts that allow the analysis of electrical properties at the nanoscale using scanning probe microscopy (SPM). While not aiming to entirely cover the wide literature on atomic force microscopy (AFM), this chapter focuses on conductive atomic force microscopy (C-AFM) and related techniques. We provide an overview followed by Sect. 3.2 that describes the setup and the possible characterization enabled by C-AFM. Due to their importance, we discuss the conductive tips, the forces acting on them and various artifacts of the technique. Section 3.3 describes an original experimental approach for the evaluation of the electrical resolution. In Sect. 3.4, the intermittent contact mode (peak force) is introduced and compared to standard contact techniques. Section 3.5 is devoted to the description of a custom solution to extend the range of measurable current with C-AFM by means of a parallel set of linear amplifiers. Finally, in Sect. we introduce the concept of scalpel SPM, that enables the three-dimensional characterization of confined volumes." @default.
• W2477987695 created "2016-08-23" @default.
• W2477987695 creator A5042281582 @default.
• W2477987695 date "2016-01-01" @default.
• W2477987695 modified "2023-10-16" @default.
• W2477987695 title "Nanoscaled Electrical Characterization" @default.
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• W2477987695 doi "https://doi.org/10.1007/978-3-319-39531-9_3" @default.
• W2477987695 hasPublicationYear "2016" @default.
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