FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W2493158283> ?p ?o ?g. }

• W2493158283 endingPage "272" @default.
• W2493158283 startingPage "195" @default.
• W2493158283 abstract "Reliability of NAND flash memory is more interesting than that of other semiconductor devices. Program and erase of NAND flash perform by electron injection and emission to/from floating gate (FG). There are several methods of electron injection and emission. For electron injection, there are two methods, namely channel hot electron (CHE) injection and Fowler-Nordheim tunneling (FN-t) injection. Data retention is degraded by electron and hole traps in tunnel oxide. Detrapping of trapped charges in tunnel oxide is a major root cause of Vt shift during the data retention test. Read disturb failure is mainly caused in the erase state after program/erase cycling stress. The stress-induced leakage current (SILC), which is generated by program/erase cycling stress, is major root cause for the read-disturb phenomena. The mechanism of erratic over program is considered to be an excess electron injection at hole trap sites in tunnel oxide." @default.
• W2493158283 created "2016-08-23" @default.
• W2493158283 creator A5049962123 @default.
• W2493158283 date "2015-12-21" @default.
• W2493158283 modified "2023-09-23" @default.
• W2493158283 title "Reliability Of Nand Flash Memory" @default.
• W2493158283 cites W1988702397 @default.
• W2493158283 cites W1993499538 @default.
• W2493158283 cites W2012535699 @default.
• W2493158283 cites W2015975185 @default.
• W2493158283 cites W2023644106 @default.
• W2493158283 cites W2025113489 @default.
• W2493158283 cites W2029667158 @default.
• W2493158283 cites W2048793855 @default.
• W2493158283 cites W2053373247 @default.
• W2493158283 cites W2071904073 @default.
• W2493158283 cites W2090424672 @default.
• W2493158283 cites W2093446542 @default.
• W2493158283 cites W2093998167 @default.
• W2493158283 cites W2096438642 @default.
• W2493158283 cites W2109154796 @default.
• W2493158283 cites W2109821714 @default.
• W2493158283 cites W2109860270 @default.
• W2493158283 cites W2109987538 @default.
• W2493158283 cites W2112166600 @default.
• W2493158283 cites W2114112542 @default.
• W2493158283 cites W2120730401 @default.
• W2493158283 cites W2123340021 @default.
• W2493158283 cites W2129573338 @default.
• W2493158283 cites W2135210684 @default.
• W2493158283 cites W2135288278 @default.
• W2493158283 cites W2136455663 @default.
• W2493158283 cites W2141252802 @default.
• W2493158283 cites W2146397282 @default.
• W2493158283 cites W2149453042 @default.
• W2493158283 cites W2151195942 @default.
• W2493158283 cites W2158188139 @default.
• W2493158283 cites W2537609863 @default.
• W2493158283 cites W2539102621 @default.
• W2493158283 cites W4236690344 @default.
• W2493158283 doi "https://doi.org/10.1002/9781119132639.ch6" @default.
• W2493158283 hasPublicationYear "2015" @default.
• W2493158283 type Work @default.
• W2493158283 sameAs 2493158283 @default.
• W2493158283 citedByCount "0" @default.
• W2493158283 crossrefType "other" @default.
• W2493158283 hasAuthorship W2493158283A5049962123 @default.
• W2493158283 hasConcept C119599485 @default.
• W2493158283 hasConcept C120398109 @default.
• W2493158283 hasConcept C120665830 @default.
• W2493158283 hasConcept C121332964 @default.
• W2493158283 hasConcept C124296912 @default.
• W2493158283 hasConcept C127413603 @default.
• W2493158283 hasConcept C131017901 @default.
• W2493158283 hasConcept C138885662 @default.
• W2493158283 hasConcept C147120987 @default.
• W2493158283 hasConcept C149635348 @default.
• W2493158283 hasConcept C163258240 @default.
• W2493158283 hasConcept C165801399 @default.
• W2493158283 hasConcept C172385210 @default.
• W2493158283 hasConcept C191897082 @default.
• W2493158283 hasConcept C192562407 @default.
• W2493158283 hasConcept C21036866 @default.
• W2493158283 hasConcept C2776531357 @default.
• W2493158283 hasConcept C2777526259 @default.
• W2493158283 hasConcept C2779851234 @default.
• W2493158283 hasConcept C2780866740 @default.
• W2493158283 hasConcept C41008148 @default.
• W2493158283 hasConcept C41895202 @default.
• W2493158283 hasConcept C43214815 @default.
• W2493158283 hasConcept C49040817 @default.
• W2493158283 hasConcept C62520636 @default.
• W2493158283 hasConcept C73500089 @default.
• W2493158283 hasConcept C86642149 @default.
• W2493158283 hasConceptScore W2493158283C119599485 @default.
• W2493158283 hasConceptScore W2493158283C120398109 @default.
• W2493158283 hasConceptScore W2493158283C120665830 @default.
• W2493158283 hasConceptScore W2493158283C121332964 @default.
• W2493158283 hasConceptScore W2493158283C124296912 @default.
• W2493158283 hasConceptScore W2493158283C127413603 @default.
• W2493158283 hasConceptScore W2493158283C131017901 @default.
• W2493158283 hasConceptScore W2493158283C138885662 @default.
• W2493158283 hasConceptScore W2493158283C147120987 @default.
• W2493158283 hasConceptScore W2493158283C149635348 @default.
• W2493158283 hasConceptScore W2493158283C163258240 @default.
• W2493158283 hasConceptScore W2493158283C165801399 @default.
• W2493158283 hasConceptScore W2493158283C172385210 @default.
• W2493158283 hasConceptScore W2493158283C191897082 @default.
• W2493158283 hasConceptScore W2493158283C192562407 @default.
• W2493158283 hasConceptScore W2493158283C21036866 @default.
• W2493158283 hasConceptScore W2493158283C2776531357 @default.
• W2493158283 hasConceptScore W2493158283C2777526259 @default.
• W2493158283 hasConceptScore W2493158283C2779851234 @default.
• W2493158283 hasConceptScore W2493158283C2780866740 @default.
• W2493158283 hasConceptScore W2493158283C41008148 @default.
• W2493158283 hasConceptScore W2493158283C41895202 @default.
• W2493158283 hasConceptScore W2493158283C43214815 @default.
• W2493158283 hasConceptScore W2493158283C49040817 @default.

• next