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- W2498014812 abstract "Visualisation of TGO growth in situ by experimental methods is highly non-trivial. One of the destructive ways of capturing the TGO growth by experiments is to treat several samples of the same coating for different operating times until failure and then inspecting the cross-sectional microstructure. However, in this case the TGO growth cannot be analysed at the same location in the TBC sample as the area inspected will differ between the samples and may not contain exactly the same surface topography. A non-destructive way could be to perform micro-computed tomography (Micro-CT) on a sample in several stages over the sample’s lifetime. This technique, apart from being extremely expensive and time consuming, can be performed usually only on a very small sample with relatively low resolution. Thermography has been successfully performed in the past to analyse the crack growth during lifetime testing, but a low resolution is obtained with this technique [1]. High temperature X-ray diffraction (XRD) was used by Czech et al. to determine the thickness of TGO in situ under isothermal conditions by measuring the intensity curves, but the TGO profile could not be detected with this technique [2]." @default.
- W2498014812 created "2016-08-23" @default.
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- W2498014812 date "2015-01-01" @default.
- W2498014812 modified "2023-09-23" @default.
- W2498014812 title "Modelling of Oxide Growth in TBCs" @default.
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- W2498014812 doi "https://doi.org/10.1007/978-3-319-17254-5_7" @default.
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