Matches in SemOpenAlex for { <https://semopenalex.org/work/W2503128478> ?p ?o ?g. }
Showing items 1 to 97 of
97
with 100 items per page.
- W2503128478 abstract "Abstract In this paper we investigate the drain stress behavior and charge trapping phenomena of GaN-based high electron mobility transistors (HEMTs). We fabricated GaN-on-Si MIS-HEMTs with different dielectric stacks in the gate and gate-drain access region and performed interface characterization and stress measurements for slow traps analysis. 2-dimensional TCAD simulations were used to compare the electrical field distributions of the devices in OFF-state stress condition. Our results show a high dependency of the on-resistance increase on interfaces in the gate-drain access region. The dielectric interfaces near the channel play a significant role for long term high voltage stress and regeneration of the device." @default.
- W2503128478 created "2016-08-23" @default.
- W2503128478 creator A5010782182 @default.
- W2503128478 creator A5031355089 @default.
- W2503128478 creator A5032007228 @default.
- W2503128478 creator A5051777540 @default.
- W2503128478 creator A5080253287 @default.
- W2503128478 creator A5091083409 @default.
- W2503128478 date "2016-11-01" @default.
- W2503128478 modified "2023-10-01" @default.
- W2503128478 title "Post drain-stress behavior of AlGaN/GaN-on-Si MIS-HEMTs" @default.
- W2503128478 cites W1967266121 @default.
- W2503128478 cites W1976560127 @default.
- W2503128478 cites W1977450210 @default.
- W2503128478 cites W1982093035 @default.
- W2503128478 cites W1998100255 @default.
- W2503128478 cites W2016580874 @default.
- W2503128478 cites W2025307127 @default.
- W2503128478 cites W2058277422 @default.
- W2503128478 cites W2074404056 @default.
- W2503128478 cites W2076044775 @default.
- W2503128478 cites W2088351781 @default.
- W2503128478 cites W2101448599 @default.
- W2503128478 cites W2113488710 @default.
- W2503128478 cites W2122510259 @default.
- W2503128478 cites W2135331478 @default.
- W2503128478 cites W2137778525 @default.
- W2503128478 cites W2150843683 @default.
- W2503128478 cites W2158437612 @default.
- W2503128478 cites W2171328005 @default.
- W2503128478 doi "https://doi.org/10.1016/j.sse.2016.07.014" @default.
- W2503128478 hasPublicationYear "2016" @default.
- W2503128478 type Work @default.
- W2503128478 sameAs 2503128478 @default.
- W2503128478 citedByCount "0" @default.
- W2503128478 crossrefType "journal-article" @default.
- W2503128478 hasAuthorship W2503128478A5010782182 @default.
- W2503128478 hasAuthorship W2503128478A5031355089 @default.
- W2503128478 hasAuthorship W2503128478A5032007228 @default.
- W2503128478 hasAuthorship W2503128478A5051777540 @default.
- W2503128478 hasAuthorship W2503128478A5080253287 @default.
- W2503128478 hasAuthorship W2503128478A5091083409 @default.
- W2503128478 hasConcept C119599485 @default.
- W2503128478 hasConcept C127413603 @default.
- W2503128478 hasConcept C133386390 @default.
- W2503128478 hasConcept C138885662 @default.
- W2503128478 hasConcept C165801399 @default.
- W2503128478 hasConcept C166972891 @default.
- W2503128478 hasConcept C172385210 @default.
- W2503128478 hasConcept C18903297 @default.
- W2503128478 hasConcept C192562407 @default.
- W2503128478 hasConcept C21036866 @default.
- W2503128478 hasConcept C2777924906 @default.
- W2503128478 hasConcept C41895202 @default.
- W2503128478 hasConcept C49040817 @default.
- W2503128478 hasConcept C86803240 @default.
- W2503128478 hasConceptScore W2503128478C119599485 @default.
- W2503128478 hasConceptScore W2503128478C127413603 @default.
- W2503128478 hasConceptScore W2503128478C133386390 @default.
- W2503128478 hasConceptScore W2503128478C138885662 @default.
- W2503128478 hasConceptScore W2503128478C165801399 @default.
- W2503128478 hasConceptScore W2503128478C166972891 @default.
- W2503128478 hasConceptScore W2503128478C172385210 @default.
- W2503128478 hasConceptScore W2503128478C18903297 @default.
- W2503128478 hasConceptScore W2503128478C192562407 @default.
- W2503128478 hasConceptScore W2503128478C21036866 @default.
- W2503128478 hasConceptScore W2503128478C2777924906 @default.
- W2503128478 hasConceptScore W2503128478C41895202 @default.
- W2503128478 hasConceptScore W2503128478C49040817 @default.
- W2503128478 hasConceptScore W2503128478C86803240 @default.
- W2503128478 hasLocation W25031284781 @default.
- W2503128478 hasOpenAccess W2503128478 @default.
- W2503128478 hasPrimaryLocation W25031284781 @default.
- W2503128478 hasRelatedWork W1964416497 @default.
- W2503128478 hasRelatedWork W2050620793 @default.
- W2503128478 hasRelatedWork W2072371118 @default.
- W2503128478 hasRelatedWork W2081901028 @default.
- W2503128478 hasRelatedWork W2101919038 @default.
- W2503128478 hasRelatedWork W2317124054 @default.
- W2503128478 hasRelatedWork W2762459570 @default.
- W2503128478 hasRelatedWork W2796021717 @default.
- W2503128478 hasRelatedWork W2889281760 @default.
- W2503128478 hasRelatedWork W2898424858 @default.
- W2503128478 hasRelatedWork W2955624864 @default.
- W2503128478 hasRelatedWork W2970615374 @default.
- W2503128478 hasRelatedWork W2991094569 @default.
- W2503128478 hasRelatedWork W2997853551 @default.
- W2503128478 hasRelatedWork W3004886142 @default.
- W2503128478 hasRelatedWork W3110193762 @default.
- W2503128478 hasRelatedWork W3184818655 @default.
- W2503128478 hasRelatedWork W3193243531 @default.
- W2503128478 hasRelatedWork W3195457907 @default.
- W2503128478 hasRelatedWork W3206665264 @default.
- W2503128478 isParatext "false" @default.
- W2503128478 isRetracted "false" @default.
- W2503128478 magId "2503128478" @default.
- W2503128478 workType "article" @default.