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- W2503269132 abstract "There are many investigations about thin film. However, these are limited to the surface layer thin film on substrates. It Is very important to know the characteristics of the extremely thin film itself such as surface layer thin film. In the present paper, the first part deals with the thickness measurements of the surface layer film and substrate by means of x-ray method, and then the measurement method of their stress - strain curves and the procedure of the measurement are described. The results obtained are discussed on the basis of their stress — strain curves." @default.
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- W2503269132 date "1990-01-01" @default.
- W2503269132 modified "2023-09-24" @default.
- W2503269132 title "The Thickness Measurements of Thin Bulk Film by X-ray Method" @default.
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- W2503269132 doi "https://doi.org/10.1154/s0376030800014889" @default.
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