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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2504322632> ?p ?o ?g. }

• W2504322632 endingPage "493" @default.
• W2504322632 startingPage "475" @default.
• W2504322632 abstract "In this chapter we describe faults that can occur in reversible circuit as compared to faults that can occur in classical irreversible circuits. Because there are many approaches from classical irreversible circuits that are being adapted to reversible circuits, it is necessary to analyze what faults that exists in irreversible circuits can appear in reversible circuit as well. Thus we focus on comparing faults that can appear in classical circuit technology with faults that can appear in reversible and quantum circuit technology. The comparison is done from the point of view of information reversible and information irreversible circuit technologies. We show that the impact of reversible computing and quantum technology strongly modifies the fault types that can appear and thus the fault models that should be considered. Unlike in the classical non-reversible transistor based circuits, in reversible circuits it is necessary to specify what type of implementation technology is used as different technologies can be affected by different faults. Moreover the level of faults and their analysis must be revised to precisely capture the effects and properties of quantum gates and quantum circuits that share several similarities with reversible circuits. By not doing so the available testing approaches adapted from classical circuits would not be able to properly detect relevant faults. In addition, if the classical faults are directly applied without revision and modifications, the presented testing procedure would be testing for such faults that cannot physically occur in the given implementation of reversible circuits. The observation and analysis of these various faults presented in this chapter clearly demonstrates what faults can occur and what faults cannot occur in various reversible technologies. Consequently the results from this chapter can be used to design more precise tests for reversible logic circuits. Moreover the clearly described differences between faults occurring in reversible and irreversible circuits means that new algorithms for fault detection should be implemented specifically for particular reversible technologies." @default.
• W2504322632 created "2016-08-23" @default.
• W2504322632 creator A5001786497 @default.
• W2504322632 creator A5022079876 @default.
• W2504322632 creator A5037191455 @default.
• W2504322632 creator A5048693034 @default.
• W2504322632 creator A5090536558 @default.
• W2504322632 date "2016-07-19" @default.
• W2504322632 modified "2023-09-27" @default.
• W2504322632 title "Fault Models in Reversible and Quantum Circuits" @default.
• W2504322632 cites W1973877994 @default.
• W2504322632 cites W1975378777 @default.
• W2504322632 cites W1991399281 @default.
• W2504322632 cites W1996378920 @default.
• W2504322632 cites W1997726046 @default.
• W2504322632 cites W2011867118 @default.
• W2504322632 cites W2018065347 @default.
• W2504322632 cites W2026202616 @default.
• W2504322632 cites W2028193792 @default.
• W2504322632 cites W2032147770 @default.
• W2504322632 cites W2037647828 @default.
• W2504322632 cites W2039319676 @default.
• W2504322632 cites W2042474962 @default.
• W2504322632 cites W2045039329 @default.
• W2504322632 cites W2049708442 @default.
• W2504322632 cites W2055890140 @default.
• W2504322632 cites W2062258079 @default.
• W2504322632 cites W2075680532 @default.
• W2504322632 cites W2083527387 @default.
• W2504322632 cites W2092345664 @default.
• W2504322632 cites W2138454200 @default.
• W2504322632 cites W2152058212 @default.
• W2504322632 cites W3121429939 @default.
• W2504322632 cites W2027179343 @default.
• W2504322632 doi "https://doi.org/10.1007/978-3-319-33924-5_19" @default.
• W2504322632 hasPublicationYear "2016" @default.
• W2504322632 type Work @default.
• W2504322632 sameAs 2504322632 @default.
• W2504322632 citedByCount "5" @default.
• W2504322632 countsByYear W25043226322018 @default.
• W2504322632 countsByYear W25043226322020 @default.
• W2504322632 countsByYear W25043226322022 @default.
• W2504322632 countsByYear W25043226322023 @default.
• W2504322632 crossrefType "book-chapter" @default.
• W2504322632 hasAuthorship W2504322632A5001786497 @default.
• W2504322632 hasAuthorship W2504322632A5022079876 @default.
• W2504322632 hasAuthorship W2504322632A5037191455 @default.
• W2504322632 hasAuthorship W2504322632A5048693034 @default.
• W2504322632 hasAuthorship W2504322632A5090536558 @default.
• W2504322632 hasConcept C119599485 @default.
• W2504322632 hasConcept C121332964 @default.
• W2504322632 hasConcept C127313418 @default.
• W2504322632 hasConcept C127413603 @default.
• W2504322632 hasConcept C134146338 @default.
• W2504322632 hasConcept C165205528 @default.
• W2504322632 hasConcept C175551986 @default.
• W2504322632 hasConcept C20274610 @default.
• W2504322632 hasConcept C41008148 @default.
• W2504322632 hasConcept C58053490 @default.
• W2504322632 hasConcept C62520636 @default.
• W2504322632 hasConcept C84114770 @default.
• W2504322632 hasConceptScore W2504322632C119599485 @default.
• W2504322632 hasConceptScore W2504322632C121332964 @default.
• W2504322632 hasConceptScore W2504322632C127313418 @default.
• W2504322632 hasConceptScore W2504322632C127413603 @default.
• W2504322632 hasConceptScore W2504322632C134146338 @default.
• W2504322632 hasConceptScore W2504322632C165205528 @default.
• W2504322632 hasConceptScore W2504322632C175551986 @default.
• W2504322632 hasConceptScore W2504322632C20274610 @default.
• W2504322632 hasConceptScore W2504322632C41008148 @default.
• W2504322632 hasConceptScore W2504322632C58053490 @default.
• W2504322632 hasConceptScore W2504322632C62520636 @default.
• W2504322632 hasConceptScore W2504322632C84114770 @default.
• W2504322632 hasLocation W25043226321 @default.
• W2504322632 hasOpenAccess W2504322632 @default.
• W2504322632 hasPrimaryLocation W25043226321 @default.
• W2504322632 hasRelatedWork W1076955533 @default.
• W2504322632 hasRelatedWork W2017920704 @default.
• W2504322632 hasRelatedWork W2074727920 @default.
• W2504322632 hasRelatedWork W2097754793 @default.
• W2504322632 hasRelatedWork W2783959710 @default.
• W2504322632 hasRelatedWork W3104288720 @default.
• W2504322632 hasRelatedWork W3121383614 @default.
• W2504322632 hasRelatedWork W3183260494 @default.
• W2504322632 hasRelatedWork W4252740254 @default.
• W2504322632 hasRelatedWork W4300449791 @default.
• W2504322632 isParatext "false" @default.
• W2504322632 isRetracted "false" @default.
• W2504322632 magId "2504322632" @default.
• W2504322632 workType "book-chapter" @default.